Adaptive sampling of reflectance fields

of reflectance fields. In this talk, sampling techniques that improve on the trade-offs between
measurement effort and reconstruction quality will be presented.

Specifically, we (i) demonstrate that sampling with point lights and from a sparse set of incoming
light directions creates artifacts, which can be reduced significantly by employing extended light
sources for sampling, (ii) propose a sampling algorithm which incrementally chooses light directions
adapted to the properties of the reflectance field being measured, thus capturing significant
features faster than fixed-pattern sampling, and (iii) combine reflectance fields from two different
light domain resolutions.

We present an automated measurement setup to achieve this. A programmable spotlight with controlled
aperture produces indirect, distant illumination on a hemicube of cloth, thus creating a well-defined
angular distribution of the illumination.