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Self-testing and self-checking combinational circuits with weakly independent outputs

Sogomonjan, E. S. and Goessel, M.

MPI-I-92-601. February 1992, 18 pages. | Status: available - back from printing | Next --> Entry | Previous <-- Entry

Abstract in LaTeX format:
In this paper we propose a structure dependent method for the systematic design
of self--checking error detection circuits wich is well adapted to the technical
fault model considered. For online detection, the hardware is in normal operation
mode, and for testing in test mode. In the test mode, these error detection circuits
guarantee a 100\% fault coverage for single stuck-at-0/1 faults and a high fault coverage
for arbitrary faults.
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  AUTHOR = {Sogomonjan, E. S. and Goessel, M.},
  TITLE = {Self-testing and self-checking combinational circuits with weakly independent outputs},
  TYPE = {Research Report},
  INSTITUTION = {Max-Planck-Institut f{\"u}r Informatik},
  ADDRESS = {Im Stadtwald, D-66123 Saarbr{\"u}cken, Germany},
  NUMBER = {MPI-I-92-601},
  MONTH = {February},
  YEAR = {1992},
  ISSN = {0946-011X},