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Author, Editor

Author(s):

Yoshizawa, Shin
Belyaev, Alexander
Seidel, Hans-Peter

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Editor(s):

Kobbelt, Leif
Shapiro, Vadim

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BibTeX cite key*:

Yoshizawa_spm05

Title, Booktitle

Title*:

Fast and Robust Detection of Crest Lines on Meshes

Booktitle*:

Proceedings of the Ninth ACM Symposium on Solid and Physical Modeling 2005

Event, URLs

URL of the conference:


URL for downloading the paper:


Event Address*:

Cambridge, Massachusetts, USA

Language:

English

Event Date*
(no longer used):


Organization:

Association for Computing Machinery (ACM)

Event Start Date:

13 June 2005

Event End Date:

15 June 2005

Publisher

Name*:

ACM

URL:

http://www.acm.org/

Address*:

New York, USA

Type:


Vol, No, Year, pp.

Series:


Volume:


Number:


Month:


Pages:

227-232

Year*:

2005

VG Wort Pages:

6

ISBN/ISSN:

1-59593-015-9

Sequence Number:


DOI:




Note, Abstract, ©

Note:

Technical Sketch

(LaTeX) Abstract:

We propose a fast and robust method for detecting
crest lines on surfaces approximated by dense triangle meshes.
The crest lines, salient surface features defined via first- and
second-order curvature derivatives, are widely used for shape
matching and interrogation purposes. Their practical extraction
is difficult because it requires good estimation of high-order
surface derivatives. Our approach to the crest line detection
is based on estimating the curvature tensor and curvature
derivatives via local polynomial fitting.
Since the crest lines are not defined in the surface regions
where the surface focal set (caustic) degenerates, we introduce
a new thresholding scheme which exploits interesting relationships
between curvature extrema, the so-called MVS functional of Moreton
and Sequin, and Dupin cyclides,
An application of the crest lines to adaptive mesh simplification
is also considered.



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Access Level:

Institute

Correlation

MPG Unit:

Max-Planck-Institut für Informatik



MPG Subunit:

Computer Graphics Group

Audience:

popular

Appearance:

MPII WWW Server, MPII FTP Server, MPG publications list, university publications list, working group publication list, Fachbeirat, VG Wort



BibTeX Entry:

@INPROCEEDINGS{Yoshizawa_spm05,
AUTHOR = {Yoshizawa, Shin and Belyaev, Alexander and Seidel, Hans-Peter},
EDITOR = {Kobbelt, Leif and Shapiro, Vadim},
TITLE = {Fast and Robust Detection of Crest Lines on Meshes},
BOOKTITLE = {Proceedings of the Ninth ACM Symposium on Solid and Physical Modeling 2005},
PUBLISHER = {ACM},
YEAR = {2005},
ORGANIZATION = {Association for Computing Machinery (ACM)},
PAGES = {227--232},
ADDRESS = {Cambridge, Massachusetts, USA},
ISBN = {1-59593-015-9},
NOTE = {Technical Sketch},
}


Entry last modified by Thomas Schultz, 07/01/2009
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Editor(s)
Shin Yoshizawa
Created
03/10/2005 07:34:12 PM
Revisions
8.
7.
6.
5.
4.
Editor(s)
Thomas Schultz
Christine Kiesel
Shin Yoshizawa
Conny Liegl
Conny Liegl
Edit Dates
2007-03-04 19:30:23
25.04.2006 19:12:18
03/11/2006 09:10:49 AM
17.01.2006 15:04:12
17.01.2006 15:03:38